CVE-2026-68991
Received Received - Intake

Memory Corruption in Samsung Exynos ENN NeuralNetworks HAL

Publication date: 2026-11-05

Last updated on: 2026-11-05

Assigner: a8bfbd5c-5645-475e-a8f4-6c140c17bd29

Description
In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition.

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Meta Information

Published
2026-11-05
Last Modified
2026-11-05
Generated
2026-11-05
AI Q&A
2026-11-05
EPSS Evaluated
N/A
NVD
CVE-2026-68991
EUVD
EUVD-2026-117284

Affected Vendors & Products

Showing 2 associated CPEs
Vendor Product Version / Range
Samsung Semiconductor Exynos 1480 0
Samsung Semiconductor Exynos 2400 0

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Exploitability

CWE
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KEV
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CWE ID Description
CWE-787 The product writes data past the end, or before the beginning, of the intended buffer.

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Executive Summary

This vulnerability is in the Samsung Exynos ENN NeuralNetworks HAL where improper input validation during request processing can cause memory corruption. This may lead to a denial of service condition, disrupting normal operations.

Impact Analysis

The vulnerability could cause system crashes or instability due to memory corruption, potentially disrupting services that rely on the Exynos ENN NeuralNetworks HAL for neural network processing tasks.

Mitigation Strategies

Update the Samsung Exynos ENN NeuralNetworks HAL to the latest patched version provided by Samsung. Disable or restrict access to the affected NeuralNetworks HAL if updates are unavailable. Monitor for unusual memory corruption or denial of service events in system logs.

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